FLIR announces InSb thermal imaging camera for research and scientific applications
Oct. 25, 2013
FLIR Systems’ X6580sc thermal imaging camera features a 640 x 512 digital InSb detector with broadband (1.5 – 5.5 µm) spectral sensitivity and F/3 aperture. The X6580sc provides images up to 350 Hz in full frame and up to 4500 Hz in a 320 x 8 sub-windowing mode. The camera connects to FLIR’s ResearchIR Max 3 R&D software to enable thermal imaging data acquisition, analysis, and reporting capabilities. It can be calibrated up to 300°C or up to 3000°C with spectral and/or neutral density filters and features a measurement accuracy of +/-1°C for standard configurations. X6580sc cameras are suitable for use in research and development and scientific imaging applications.
To Learn More:
Contact:FLIR
Headquarters: Wilsonville, OR, USA
Product: X6580sc thermal imaging camera
Key Features: 640 x 512 digital InSb detector with broadband (1.5 – 5.5 µm) spectral sensitivity and F/3 aperture, 350 Hz in full frame and up to 4500 Hz in a 320 x 8 sub-windowing mode.
What FLIR says:
View more information on FLIR X6000sc cameras.
View More Products| Locate a vendor or system integrator | Receive e-mail updates
Share new products that you think are particularly interesting or helpful by contacting James Carroll, Senior Web Editor, Vision Systems Design.
Join our LinkedIn group | Like us on Facebook | Follow us on Twitter | Connect on Google +
Former VSD Editor James Carroll joined the team 2013. Carroll covered machine vision and imaging from numerous angles, including application stories, industry news, market updates, and new products. In addition to writing and editing articles, Carroll managed the Innovators Awards program and webcasts.
