Edmund Optics introduces PCX lenses designed for metrology and laser applications
Feb. 3, 2015
Edmund Optics has announced the release of its TECHSPEC λ/20 PCX lenses, which are ideal for a range of uses that require minimal wavefront distortion, including laser and metrology applications. The lenses feature a precision-fused silica substrate, λ/20 surface accuracy and 20-10 surface quality. These RoHS-compliant lenses have a wavelength range of 0.2 - 2.2 μm and a clear aperture of 24. Each lens is available with a full data package that includes interferogram and measured results for diameter, radius, center thickness and centration. In addition, the lenses are offered uncoated with a 25 mm diameter and focal lengths of 50 mm, 75 mm, 100 mm and 150 mm.
To Learn More:
Contact: Edmund Optics
Headquarters: Barrington, NJ, USA
Product: TECHSPEC λ/20 PCX lenses
Key Features: Precision-fused silica substrate, λ/20 surface accuracy and 20-10 surface quality, 25 mm diameter and focal lengths of 50 mm, 75 mm, 100 mm and 150 mm.
What Edmund Optics says:
View more information on the TECHSPEC λ/20 PCX lenses.
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Former VSD Editor James Carroll joined the team 2013. Carroll covered machine vision and imaging from numerous angles, including application stories, industry news, market updates, and new products. In addition to writing and editing articles, Carroll managed the Innovators Awards program and webcasts.
