SuaKIT v2.0 deep learning software launched by SUALAB
SuaKIT 2.0, the latest deep learning software library for machine vision applications, has been released by Sualab. The software—which will be on display the company’s booth at The Vision Show 2018—improves upon SuaKIT v1.0, which introduced automated defect inspection in various manufacturing sectors by applying deep learning algorithms. The four major upgrades of v2.0 include image comparison (analyzes differences between two images), detection mode (detects and classifies numerous objects in one image), visual labeler (recommends areas of defects in a product), and visual debugger (visualizes areas inspection by deep learning algorithms).
The Vision Show 2018: 1112
To Learn More:
Contact:SUALAB
Headquarters: Seoul, South Korea
Product: SuaKIT 2.0 deep learning-based machine vision inspection software
Key Features: Image comparison, detection mode, visual labeler, and visual debugger.
What SUALAB says:
View more information on the software.
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About the Author
James Carroll
Former VSD Editor James Carroll joined the team 2013. Carroll covered machine vision and imaging from numerous angles, including application stories, industry news, market updates, and new products. In addition to writing and editing articles, Carroll managed the Innovators Awards program and webcasts.