MVTec to showcase HALCON machine vision software at AIA Vision Show
March 24, 2014
MVTec will be showcasing its HALCON machine vision library, which is a solution for detecting 3D surface defects and locating objects in 3D point clouds, at the AIA Vision Show in Boston from April 15-17. HALCON enables matching, blob analysis, morphology, measuring, and 3D vision applications in an integrated development environment. In addition, HALCON can be used for calibration, OCR and OCV, barcode and data reading, and is available for Windows, Linux, and Mac OS X. MVTec recently announced a USB3 Vision interface for HALCON, which will provide bandwidth in excess of 350 MB/s and a plug and play interface.
AIA Vision Show booth number: 301
To Learn More:
Contact:MVTec
Headquarters: Munich, Germany
Product: HALCON machine vision software
Key Features: Matching, blob analysis, morphology, measuring, 3D vision, calibration, OCR/OCV, barcode and data reading.
What MVTec says:
View more information on HALCON machine vision software.
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Former VSD Editor James Carroll joined the team 2013. Carroll covered machine vision and imaging from numerous angles, including application stories, industry news, market updates, and new products. In addition to writing and editing articles, Carroll managed the Innovators Awards program and webcasts.
