SWIR line scan detectors to be introduced by Xenics at LASER World of Photonics 2017

Xenics will introduce the XLIN-FC SQ and the XLIN-FC R series of high-speed SWIR line scan detectors at LASER World of Photonics from June 26-29 in Munich, Germany. The XLIN-FC R feature rectangular pixels for spectroscopy applications and the XLIN-FC SQ has square pixels for machine vision. Both detectors operate in low-light conditions via a new read-out integrated circuit developed by Xenics, while offering a high quantum efficiency in the 900 – 1700 nm wavelength range. Additionally, the line scan detectors are available in 512, 1024, or 2048 pixel models and can reach line rates of up to 400 kHz. Total array lengths for the detectors do not exceed 25.6 mm.

LASER World of Photonics 2017 booth number: Hall B3, Booth 303

To Learn More:

Contact: Xenics
Headquarters: Leuven, Belgium
Product: XLIN-FC SQ and the XLIN-FC R SWIR line scan detectors
Key features: Rectangular or square 12.5 µm pixels, new read-out integrated circuit, the 900 – 1700 nm wavelength range, available in 512, 1024, or 2048 pixel models.

What Xenics says:
View more information on XENICS infrared detectors. (Product link forthcoming.)

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