Machine vision cameras from Hikvision will be demonstrated at The Vision Show 2018
At The Vision Show 2018, Hikvision will showcase its line of machine vision cameras, including area scan, line scan, and industrial smart cameras.
The MV-CH290-60GM 29MP area scan camera (pictured) features the 29 MPixel KAI29050 CCD image sensor from ON Semiconductor, which features a 5.5 µm pixel size and 4 fps frame rate. It supports serial communication using RS-232 or RS-485 and has a GigE interface that enables up to 300 ft. of real-time, lossless video transmission.
Featuring a 2048 x 1 monochrome CMOS line scan image sensor with 7 µm pixel size, the MV-CL020-40GM line scan camera also has a GigE interface and scan up 51,000 lines per second, useful for applications such as under vehicle screening and rapid textile inspection, according to Hikvision.
Also on display will be the MV-SI622-01GM industrial smart camera, which is based on a 5 MPixel PYTHON 5000 monochrome CMOS image sensor from ON Semiconductor, which has a 4.8 µm pixel size and a frame rate of 30 fps. This smart camera has a range of functions to support factory automation applications, including an embedded code-reading algorithm for barcode reading, as well as a GigE interface, various I/O interfaces, an Intel E3845 quad-core processor, and IP67 protective housing.
The Vision Show 2018 booth number: 333
To Learn More:
Contact:Hikvision
Headquarters: Hangzhou, China
Products: MV-CH290-60GM 29MP area scan camera, MV-CL020-40GM line scan camera, and MV-SI622-01GM industrial smart camera.
What Hikvision says:
View more information on the MV-CH290-60GM.
View more information on the MV-CL020-40GM.
View more information on the MV-SI622-01GM
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About the Author
James Carroll
Former VSD Editor James Carroll joined the team 2013. Carroll covered machine vision and imaging from numerous angles, including application stories, industry news, market updates, and new products. In addition to writing and editing articles, Carroll managed the Innovators Awards program and webcasts.