CMOS image sensors have been replacing traditional CCD based imagersfor most consumer applications due to the integration possibilities of on-chip readout electronics. Still, CCD technology is superior in terms of noise when it comes to transfer of charge, whereas CMOS is suffering from noise in the voltage domain. On the other hand, CCD technology does not allow integrated complex readout on-chip, resulting in a complex system.
In a webcast on June 6, Piet De Moor, Program Manager Optical Sensors at imec (pictured), will provide an in-depth look at the world of image sensors, including the different types of sensors available, including line scan and area array. The webcast will discuss TDI line scan cameras, color line scan cameras, and the ways that this technology is implemented (e.g. RGB, spectral filters, pixel pitches, and the different performance tradeoffs).
The differences between implementing these in CMOS vs CCD technology, including frame transfer speed, resolution, region of interest readout, quantum efficiency, fill factor, on-pixel processing, will also be covered. Lastly, De Moor will provide insight on which imager to choose for a particular application, with examples. The webcast will conclude with a question and answer period.
Webcast information:
Comparing CCD, CMOS, and hybrid CCD/CMOS TDI image sensors
Piet De Moor, Program Manager Optical Sensors, imec
June 6, 2018 11:00 AM EDT
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