Dual Sided Wafer Chip Inspection System (Model 7940)
April 23, 2020
Chroma 7940 dual sided wafer chip inspection system is an automated inspection system for post-diced wafer chip inspection. It is capable of inspecting both top and bottom view of the wafer chip simultaneously.
Chroma 7940 wafer chip inspection system is an automated inspection system for post-diced wafer chip inspection. It is capable of inspecting both top and bottom view of the wafer chip simultaneously. Utilizing an advanced illumination technology and color camera acquisition, the system can be customized for various wafer processes and test configuration such as vertical chip or flip chip inspection.
