Reader sets new performance standard

In-Sight 1721 wafer reader tracks semiconductor wafers through the manufacturing process. It offers a slimmer package and twice the speed of its predecessors, yet maintains mounting and functional compatibility with them. Advanced image-formation technology and OCR and 2-D matrix and barcode-recognition algorithms enable the In-Sight 1721 to deliver reliable reading performance on SEMI-standard scribes.
Oct. 17, 2005

In-Sight 1721 wafer reader tracks semiconductor wafers through the manufacturing process. It offers a slimmer package and twice the speed of its predecessors, yet maintains mounting and functional compatibility with them. Advanced image-formation technology and OCR and 2-D matrix and barcode-recognition algorithms enable the In-Sight 1721 to deliver reliable reading performance on SEMI-standard scribes. The reader offers flexible mounting options for easy installation on wafer sorters, ion implanters, probers, and other tools. A graphical user interface simplifies setup, and automatic tuning minimizes operator intervention. Built-in network and serial communications provide connectivity to other process tools and the plant network.
Cognex
Natick, MA, USA
www.cognex.com

Sign up for Vision Systems Design Newsletters

Related

AI and Rugged Edge Computing Are Fueling a Range of Applications
Zebra Technologies Integrates Acquisitions into Machine Vision Product Line

Voice Your Opinion!

To join the conversation, and become an exclusive member of Vision Systems Design, create an account today!