WEBINAR
The Fundamentals of Using Machine Vision Technology in Metrology Applications
February 25, 2025
7:00 PM UTC
1 hour
Speaker
This webinar was originally broadcast on February 25, 2025.
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Summary
Join machine vision expert David Dechow as he explains how to use machine vision technology for inline, non-contact metrology, or measurement, applications. He will cover the fundamental techniques for using machine vision technologies for metrology and detail best practices for system design and integration.
David Dechow
Founder and Owner
Machine Vision Source
David Dechow has over 35 years of hands-on engineering and design experience in machine vision technology and systems integration. Mr. Dechow is the 2007 recipient of the AIA Automated Imaging Achievement Award honoring industry leaders for outstanding career contributions in industrial and/or scientific imaging.
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