WEBINAR

The Fundamentals of Using Machine Vision Technology in Metrology Applications

Discover how machine vision expert David Dechow unlocks the potential of inline, non-contact metrology, sharing essential techniques and best practices for system design and integration in this insightful session.
February 25, 2025
7:00 PM UTC
1 hour

February 25, 2025
2:00 PM ET / 1:00 PM CT / 11:00 AM PT / 6:00 PM GMT

 
Duration: 1 hour
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Summary

Join machine vision expert David Dechow as he explains how to use machine vision technology for inline, non-contact metrology, or measurement, applications. He will cover the fundamental techniques for using machine vision technologies for metrology and detail best practices for system design and integration.

Speaker

David Dechow

Founder and Owner

Machine Vision Source

David Dechow has over 35 years of hands-on engineering and design experience in machine vision technology and systems integration. Mr. Dechow is the 2007 recipient of the AIA Automated Imaging Achievement Award honoring industry leaders for outstanding career contributions in industrial and/or scientific imaging.

Sponsored by:

Zebra Technologies